Amorphous SiO $_{2}$ /SiC interface defect structure generated with first-principles molecular dynamics simulation

Miyashita, Atsumi; Onuma, Toshiharu*; Iwasawa, Misako*; Tsuchida, Hidekazu*; Yoshikawa, Masahito

no abstracts in English

Language	:	English
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Meeting title	:	Materials Research Society 2008 Fall Meeting
Held date	:	2008/12
Location (city)	:	Boston
Location (country)	:	U.S.A.
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Cooperating Institute	:	電力中央研究所

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Registration No. : BB20082870
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Amorphous SiO/SiC interface defect structure generated with first-principles molecular dynamics simulation

Amorphous SiO $_{2}$ /SiC interface defect structure generated with first-principles molecular dynamics simulation