Behavior of secondary-particles in a MeV-class electrostatic accelerator

Mizuno, Takatoshi; Inoue, Takashi; Taniguchi, Masaki; Kashiwagi, Mieko; Umeda, Naotaka; Tobari, Hiroyuki; Dairaku, Masayuki; Watanabe, Kazuhiro

In an accelerator for a N-NBI, there are several processes of secondary-particle production such as the collision of H ions with H gas, extraction of H ions from beam plasma, and secondary-electron emission. The secondary particles cause heat load to the NBI components. It is necessary to analyze behavior of them in the accelerator. In this report, the secondary-particle behavior in MAMuG type MeV accelerator at JAEA has been analyzed by EAMCC. In the result, it is clarified that about 40% of H ions extracted from the ion source were lost by the stripping process in the MeV accelerator. More than 90% of the heat load to the intermediate grids was caused by collision of the electrons. A comparison of results obtained from experiments and present analyses showed different tendency in the currents flowing into the 2nd and the 3rd intermediate grids. This is supposed due to H ions extracted from beam plasma as a possible cause of the difference.