Momentum-resolved and element-selective spectroscopy by resonant inelastic X-ray scattering

Ishii, Kenji

Recent development of brilliant X-rays from the third generation synchrotron radiation source enables us to develop new experimental techniques in condensed matter physics and materials science. One of them is the inelastic X-ray scattering in the hard X-ray regime to investigate electronic excitations. It has a great advantage of momentum resolution over conventional optical methods. In addition, we can measure element-selective excitation spectra by resonant inelastic X-ray scattering (RIXS), which occurs when the incident X-ray energy is tuned near an absorption edge of a constituent element. While inelastic neutron scattering gives spin or lattice dynamics, inelastic X-ray scattering can be a tool to measure charge dynamics in solids through the coupling of photon to the charge of the electron. I will present recent topics in our RIXS studies of strongly correlated electron systems.