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Irradiation energy dependence of ion probes on soft error rate in SOI-SRAM

Abo, Satoshi*; Mokuno, Yoshiaki*; Kinomura, Atsushi*; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi; Iwamatsu, Toshiaki*; Takai, Mikio*

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