Irradiation energy dependence of ion probes on soft error rate in SOI-SRAM

Abo, Satoshi*; Mokuno, Yoshiaki*; Kinomura, Atsushi*; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi; Iwamatsu, Toshiaki*; Takai, Mikio*

no abstracts in English

Language	:	English
Journal	:	Proceedings of the 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-8)
Volume	:
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Pages	:	p.183 - 186
Publication Year/Month	:	2008/12
Meeting title	:	8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-8)
Held date	:	2008/12
Location (city)	:	Tsukuba
Location (country)	:	Japan
Patent information	:
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DOI for research data	:
Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	大阪大学

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Registration No. : BB20083548
JAEA Abstracts No. : 37000567
Paper Submission No. : 5571

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