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Development of secondary ion mass spectroscopy using medium energy C$$_{60}$$ ion impact

中エネルギーC$$_{60}$$イオン衝突を用いた2次イオン質量分析法の開発

平田 浩一*; 齋藤 勇一; 千葉 敦也; 阿達 正浩*; 山田 圭介; 鳴海 一雅

Hirata, Koichi*; Saito, Yuichi; Chiba, Atsuya; Adachi, Masahiro*; Yamada, Keisuke; Narumi, Kazumasa

Time-of-flight (TOF) secondary ion mass spectroscopy was performed using primary C$$_{60}$$ ions with an energy range from several tens of keV to several hundreds of keV. Application of the spectroscopy to the analysis of a poly(amino acid) film revealed that characteristic peaks, necessary for identification of the amino acid in proteins, show higher intensities for medium energy C$$_{60}$$ (120 keV C$$_{60}^{+}$$ and 540 keV C$$_{60}^{2+}$$) impacts than those for low energy C$$_{60}$$ (30 keV C$$_{60}^{+}$$) impacts. This finding demonstrates that medium energy C$$_{60}$$ ion impacts are useful for highly sensitive characterization of amino acids.

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パーセンタイル:42.18

分野:Instruments & Instrumentation

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