ion impactイオン衝突を用いた2次イオン質量分析法の開発平田 浩一*; 齋藤 勇一; 千葉 敦也; 阿達 正浩*; 山田 圭介; 鳴海 一雅
Hirata, Koichi*; Saito, Yuichi; Chiba, Atsuya; Adachi, Masahiro*; Yamada, Keisuke; Narumi, Kazumasa
Time-of-flight (TOF) secondary ion mass spectroscopy was performed using primary C ions with an energy range from several tens of keV to several hundreds of keV. Application of the spectroscopy to the analysis of a poly(amino acid) film revealed that characteristic peaks, necessary for identification of the amino acid in proteins, show higher intensities for medium energy C (120 keV C
and 540 keV C
) impacts than those for low energy C (30 keV C) impacts. This finding demonstrates that medium energy C ion impacts are useful for highly sensitive characterization of amino acids.
使用言語 |
: | English |
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巻 |
: | 266 |
号 |
: | 10 |
ページ数 |
: | p.2450 - 2452 |
発行年月 |
: | 2008/05 |
発表会議名 |
: | 9th European Conference on Accelerators in Applied Research and Technology (ECAART-9) |
開催年月 |
: | 2007/09 |
開催都市 |
: | Florence |
開催国 |
: | Italy |
キーワード |
: | no keyword |
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受委託・共同研究相手機関 |
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- Accesses |
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パーセンタイル：64.63 分野：Instruments & Instrumentation |
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