irradiated with high energy ions, 3Ohara, Kota; Ishikawa, Norito 
; Sakai, Seiji; Matsumoto, Yoshihiro; Michikami, Osamu*; Ota, Yasuyuki*; Kimura, Yutaka*
Irradiation-induced new X-ray diffraction peak is analyzed based on the model that nano-meter size ion tracks are formed in ion-irradiated CeO. X-ray diffraction profile can be interpreted by taking account of overlapping effect.
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: | Japanese |
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Held date |
: | 2009/03 |
Location (city) |
: | 東京 |
Location (country) |
: | 日本 |
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: | no keyword |
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