Low threshold ablation of large bandgap LiF dielectrics induced by picosecond soft X-ray laser pulses

Faenov, A. Y.; Inogamov, N. A.*; Zhakhovskii, V.*; Khokhlov, V. A.*; Nishihara, Katsunobu*; Kato, Yoshiaki* ; Tanaka, Momoko; Pikuz, T.*; Kishimoto, Maki; Ishino, Masahiko; Nishikino, Masaharu; Nakamura, Tatsufumi; Fukuda, Yuji; Bulanov, S. V.; Kawachi, Tetsuya

Experimental and theoretical investigations of large bandgap LiF dielectrics ablation threshold induced by 7 ps 13.9 nm XRL pulses were performed. LiF crystal threshold is about 1600, 210 and 8 times smaller compare with LiF crystal thresholds measured previously for ns and fs visible lasers and ns 46.9 nm soft XRL, correspondently.

Language	:	English
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Meeting title	:	4th International Workshop on Warm Dense Matter (WDM 2009)
Held date	:	2009/03
Location (city)	:	Hakone
Location (country)	:	Japan
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Keywords	:	no keyword
Research Facility	:	Tキューブレーザー施設
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Registration No. : BB20083723
JAEA Abstracts No. :
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