Binomial distribution function for intuitive understanding of fluence dependence of non-amorphized ion-track area

Ishikawa, Norito ; Ohara, Kota; Ota, Yasuyuki*; Michikami, Osamu*

In this experiment, CeO $_{2}$ thin films are irradiated with 200 MeV Au to investigate the damage created by electronic energy deposition. The damage is studied by Raman spectroscopy.

Language	:	English
Journal	:	Nuclear Instruments and Methods in Physics Research B
Volume	:	268
Number	:	19
Pages	:	p.3273 - 3276
Publication Year/Month	:	2010/10
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Paper URL	:	https://doi.org/10.1016/j.nimb.2010.06.006
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	タンデム加速器
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Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:56.82 Category:Instruments & Instrumentation
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Registration No. : AA20090035
JAEA Abstracts No. : 38001506
Paper Submission No. : 8170

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