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Report No.

Diffusion behaviors of plutonium and americium in polycrystalline urania

Sato, Isamu; Tanaka, Kosuke; Arima, Tatsumi*

UO$$_{2}$$ discs and Am containing MOX discs were prepared to be diffusion couples. They were annealed for 4.5 h at 1600$$^{circ}$$C in a furnace under the constant oxygen partial pressures, and then concentrations of Pu and Am across the interfaces of them were measured with EPMA. The average diffusion coefficients of Pu and Am were obtained from the concentration profiles and were between 10$$^{-15}$$ and 10$$^{-13}$$m/s$$^{2}$$, in which the difference between Pu and Am was undetermined. This indicates that the difference between redistributions of Pu and Am found in a PIE may not be caused by the diffusion but by the other transport phenomenon. Moreover, the diffusion behavior was affected by existence of grain boundaries and the oxygen partial pressure in the furnace during annealing. From the affection of the grain boundary to the diffusion, the "practical" diffusion estimation may need grain boundary modeling.



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