Resonant magnetic X-ray diffraction study under pulsed high magnetic field

Inami, Toshiya; Owada, Kenji; Matsuda, Yasuhiro*; Ouyang, Z. W.*; Nojiri, Hiroyuki*; Matsumura, Takeshi*; Okuyama, Daisuke*; Murakami, Yoichi*

In the last five years, the active development of X-ray diffraction techniques under pulsed high magnetic field has enabled us to observe structural changes of crystals above 30 T. Since X-rays are also an experimental tool for detecting electronic degrees of freedom through resonant process, the development of resonant X-ray diffraction techniques under pulsed high magnetic field introduces a new microscopic probe to the high magnetic field science. After several improvements of the experimental techniques, we observed field dependence of the 100 and 500 magnetic reflections of the tetragonal rare-earth tetraboride TbB, which exhibits a number of magnetization plateaus between 16 T and 28 T. The obtained field, polarization, and scattering angle dependence indicates that magnetic moments perpendicular to the magnetic field exist in the high-field plateau phases. This result is inconsistent with normal fractional magnetization plateau phases that consist of up and down spins.