Structural characterization and dielectric properties of hexagonal Lu(Fe,Ti)O $_{3}$

Matsuo, Yoji*; Hoshiyama, Takuya*; Mori, Shigeo*; Yoshii, Kenji ; Michiue, Yuichi*; Kambe, Takashi*; Ikeda, Naoshi*; Brown, F.*; Kimizuka, Noboru*

We have investigated an average crystal structure and microstructures in LuFe $_{0.56}$ Ti $_{0.44}$ O $_{3}$ by the transmission electron microscopy (TEM), in combination with the dielectric measurements. In this work, high-qualitypolycrystalline samples of LuFe $_{0.56}$ Ti $_{0.44}$ O $_{3}$ were successfully synthesized in air by the conventional solid state reaction. The average crystal structure at room temperature is characterized by the hexagonal structure (space group: 6 $_{3}$ cm). Dielectric measurements revealed that LuFe $_{0.56}$ Ti $_{0.44}$ O $_{3}$ shows broad dielectric dispersion around 570 K, which should originate from the formation of the polar domain structures on the nanometer scale.

Language	:	English
Journal	:	Japanese Journal of Applied Physics
Volume	:	48
Number	:	9
Pages	:	p.09KB04_1 - 09KB04_3
Publication Year/Month	:	2009/10
Meeting title	:	第26回強誘電体応用会議(FMA-26)
Held date	:	2009/05
Location (city)	:	京都
Location (country)	:	日本
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Paper URL	:	https://doi.org/10.1143/JJAP.48.09KB04
DOI for research data	:	Link to research data related to this paper/report.
Keywords	:	no keyword
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Registration No. : BB20090497
JAEA Abstracts No. : 38000039
Paper Submission No. : 6621

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