Refine your search�ソスF     
Report No.

Structural characterization and dielectric properties of hexagonal Lu(Fe,Ti)O$$_{3}$$

Matsuo, Yoji*; Hoshiyama, Takuya*; Mori, Shigeo*; Yoshii, Kenji  ; Michiue, Yuichi*; Kambe, Takashi*; Ikeda, Naoshi*; Brown, F.*; Kimizuka, Noboru*

We have investigated an average crystal structure and microstructures in LuFe$$_{0.56}$$Ti$$_{0.44}$$O$$_{3}$$ by the transmission electron microscopy (TEM), in combination with the dielectric measurements. In this work, high-qualitypolycrystalline samples of LuFe$$_{0.56}$$Ti$$_{0.44}$$O$$_{3}$$ were successfully synthesized in air by the conventional solid state reaction. The average crystal structure at room temperature is characterized by the hexagonal structure (space group: $$P$$6$$_{3}$$ cm). Dielectric measurements revealed that LuFe$$_{0.56}$$Ti$$_{0.44}$$O$$_{3}$$ shows broad dielectric dispersion around 570 K, which should originate from the formation of the polar domain structures on the nanometer scale.



- Accesses




Category:Physics, Applied



[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.