Soft-error rate in a logic LSI estimated from SET pulse-width measurements

Makino, Takahiro; Kobayashi, Daisuke*; Hirose, Kazuyuki*; Takahashi, Daisuke*; Ishii, Shigeru*; Kusano, Masaki*; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi

SET-induced soft-error rates ( $SER_{SET}$ s) of logic LSIs are estimated from SET pulse-widths measured in logic cells used in logic LSIs. The estimated rates are consistent with directly measured $SER_{SET}$ s for logic LSIs.

Language	:	English
Journal	:	IEEE Transactions on Nuclear Science
Volume	:	56
Number	:	6
Pages	:	p.3180 - 3184
Publication Year/Month	:	2009/12
Meeting title	:	2009 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2009)
Held date	:	2009/07
Location (city)	:	Qubec
Location (country)	:	Canada
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1109/TNS.2009.2033795
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	宇宙航空研究開発機構

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Registration No. : BB20090943
JAEA Abstracts No. : 38000178
Paper Submission No. : 6765

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