Analytical methods using a positron microprobe

陽電子マイクロプローブによる材料分析

岡 壽崇   ; 神野 智史*   ; 藤浪 真紀*

Oka, Toshitaka; Jinno, Satoshi*; Fujinami, Masanori*

陽電子は、材料中の欠陥を検出することができ、また、電子と異なる散乱プロセスを経るため、材料分析に広く使用されてきた。1980年代には陽電子ビームの単色化とマイクロビーム化が行われ、陽電子を用いた材料分析法はさらに発展した。本論文では、マイクロビーム化技術と、マイクロビームの材料分析への応用についてレビューする。

Positrons have been used for material analysis not only because of their novel characteristics, such as an ability to detect open-volume type defects in materials, but also because interactions with solids differ from those of electrons in such processes as scattering and diffraction. Monoenergetic positron beams and microbeams were developed in the 1980s, and positron experiments have made progress in material analyses. In this article we review the fundamental technique of microbeam fabrication, especially using a magnetically-guided positron beam, its extension to various analytical methods, and expectations for future research.