Investigation of structural and electronic properties in Ru perovskite oxides by XAFS measurements

Mizumaki, Masaichiro*; Yoshii, Kenji ; Hinatsu, Yukio*; Doi, Yoshihiro*; Uruga, Tomoya*

The electronic and structural properties of Ru oxides were investigated by utilizing X-ray absorption spectroscopy (XAS). We estimate the valence of Ru in perovskite ruthenium oxides by XAS measurements. XAS measurements were carried out at room temperature around Ru K-edge. The valence of Ru in $_{2}$ ( = Ba, Sr)LnRuO $_{6}$ and ( = Ca, Ba, Sr)RuO $_{3}$ was 4+. The valence of Ru in Ln $_{3}$ RuO $_{7}$ was 5+. The valence of Ru in PbRuO $_{3}$ showed an intermediate value between 4+ and 5+. Theoretical calculation reproduced the experimental spectra. We analyzed XAS spectra and obtained information of local structure. The bond length between Ru and O was consistent with the results of neutron diffraction.

Language	:	English
Journal	:	Physica Scripta
Volume	:	T115
Number	:
Pages	:	p.513 - 515
Publication Year/Month	:	2005/00
Meeting title	:	11th International Workshop on Plasma-Facing Materials and Components for Fusion Applications (PFMC 2006)
Held date	:	2006/10
Location (city)	:	Greifswald
Location (country)	:	Germany
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Keywords	:	no keyword
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Registration No. : BB20093875
JAEA Abstracts No. :
Paper Submission No. : 7235

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