In situ XPS depth-profiling of hydrogen storage material VCrTi during thermal annealing

Harries, J.; Teraoka, Yuden; Yoshigoe, Akitaka ; Tode, Mayumi

VCrTi is a candidate material for hydrogen storage, and as such information about its surface layer composition is essential. We have used angle-resolved photoelectron spectroscopy to obtain information on the depth distribution of the elements within the alloy, and their chemical states. Also, the changes in this composition are investigated as the temperature of the sample is raised in 100 degree increments up to 800 degrees Centigrade.

Language	:	English
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Meeting title	:	American Vacuum Society 56th International Symposium & Exhibition
Held date	:	2009/11
Location (city)	:	San Jose
Location (country)	:	U.S.A.
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Keywords	:	no keyword
Research Facility	:	SPring-8(大型放射光施設)
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Registration No. : BB20092341
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