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Report No.

Intensity correlation measurement system by picosecond single shot soft X-ray laser

Kishimoto, Maki; Namikawa, Kazumichi*; Sukegawa, Kota*; Yamatani, Hiroshi*; Hasegawa, Noboru; Tanaka, Momoko

We developed a new soft X-ray speckle intensity correlation spectroscopy system by use of a single shot high brilliant plasma soft X-ray laser. The plasma soft X-ray laser is characterized by several picoseconds in pulse width, more than 90% special coherence, and 10$$^{11}$$ soft X-ray photons within a single pulse. We developed a Michelson type delay pulse generator using a soft X-ray beam splitter to measure the intensity correlation of X-ray speckles from materials and succeeded in generating double coherent X-ray pulses with picosecond delay times. Moreover, we employed a high-speed soft X-ray streak camera for the picosecond time-resolved measurement of X-ray speckles. We performed the X-ray speckle intensity correlation measurements for probing the relaxation phenomena of polarizations in polarization clusters in the paraelectric phase of the ferroelectric material BaTiO$$_{3}$$ near its Curie temperature and verified its performance.



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Category:Instruments & Instrumentation



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