Thermal degradation process of deuterium ion implanted VCrTi using high-resolution soft X-ray synchrotron radiation photoelectron spectroscopy

Tode, Mayumi; Harries, J.; Teraoka, Yuden; Yoshigoe, Akitaka 

In order to study the relationships between the thermal desorption of hydrogen and the surface properties we have used high-resolution synchrotron radiation X-ray photoelectron spectroscopy to study the thermal degeneration processes of the surface layers. The experiments were performed at the JAEA soft X-ray beamline BL23SU at SPring-8, using the "SUREAC2000" surface reaction analysis apparatus. Spectra were recorded for two samples (VCrTi) covered with native oxide layers, one of which was implanted with deuterium ions. For the un-implanted sample, the oxide layer changes dramatically between 373 K and 473 K, for the deuterium-implanted sample, the change occurs between 473 K and 573 K. The implantation of deuterium leads to a stabilization (of approximately 100 K) of the surface oxide layer.