Three-dimensional microstructure analysis using electron tomography method and its development to mechanical property evaluation

Mitsuhara, Masatoshi*; Oshibuchi, Kota*; Hata, Satoshi*; Ikeda, Kenichi*; Nakashima, Hideharu*; Otsuka, Satoshi ; Kaito, Takeji ; Inoue, Masaki

no abstracts in English

Language	:	Japanese
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Meeting title	:	日本顕微鏡学会第66回学術講演会
Held date	:	2010/05
Location (city)	:	名古屋
Location (country)	:	日本
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Keywords	:	no keyword
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Cooperating Institute	:	九州大学

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Registration No. : BB20093707
JAEA Abstracts No. :
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