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Report No.

Evaluation of soft error rates using nuclear probes in bulk and SOI SRAMs with a technology node of 90 nm

Abo, Satoshi*; Masuda, Naoyuki*; Wakaya, Fujio*; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi; Iwamatsu, Toshiaki*; Takai, Mikio*

no abstracts in English



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Category:Instruments & Instrumentation



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