Evaluation of the white neutron beam spectrum for single-event-effects testing at the RCNP cyclotron facility

Iwamoto, Yosuke   ; Fukuda, Mitsuhiro*; Sakamoto, Yukio; Tamii, Atsushi*; Hatanaka, Kichiji*; Takahisa, Keiji*; Nagayama, Keiichi*; Asai, Hiroaki*; Sugimoto, Kenji*; Nashiyama, Isamu*

The 30 white neutron beam at RCNP facility has been characterized as a prove suitable for testing of single event effects (SEEs) in semiconductors in the neutron energy range from 1 to 300 MeV using the 392-MeV proton incident reaction on a 6.5-cm-thick tungsten target. The neutron spectrum in measurements were demonstrated to provide a neutron spectrum similar to the terrestrial one at sea level, but with an enhancement in the intensity of a factor of 1.510. The average neutron intensity and spectrum from 10 to 300 MeV at RCNP were almost same as those at WNR. The calculated RCNP neutron flux using PHITS generally agreed with the measured RCNP data within a factor of two. As the neutron density per pulse for RCNP is 500 times lower than that for WNR, the pileup probability of single-event transient currents and false multiple-bit upsets is reduced. Such conditions at RCNP are suitable for accelerated SEE testing to get meaningful results in realistic time frame.