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Report No.

Fast single-ion hit system for heavy-ion microbeam at TIARA cyclotron, 3

Yokota, Wataru; Sato, Takahiro; Okumura, Susumu; Kurashima, Satoshi; Miyawaki, Nobumasa; Kashiwagi, Hirotsugu; Yoshida, Kenichi; Koka, Masashi; Takano, Katsuyoshi; Kamiya, Tomihiro

Microbeam and single-ion hit of 260 MeV-$$^{20}$$Ne$$^{7+}$$ and/or 520 MeV-$$^{40}$$Ar$$^{14+}$$ were utilized to irradiate living biological cells for study of radiation biology, semiconductor devices for study of radiation effects such as Single Event Upset and polymer films for study of micro-fabrication in fiscal 2009 at the TIARA cyclotron. Although these beams were generally supplied smoothly, we still have technical matters to improve for better beam quality. One of the major subjects is instability of microbeam, and another is miss hit, no ion hit around a targeted point. The paper describes investigation of the causes of those as well as development of new ion beams to be available for microbeam and single-ion hit.



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