High sensitive and reliable FFDL technique for SFR using laser resonance ionization mass spectrometry

Ito, Chikara ; Iwata, Yoshihiro ; Harano, Hideki*; Iguchi, Tetsuo*; Aoyama, Takafumi

no abstracts in English

Language	:	English
Journal	:	Transactions of the American Nuclear Society
Volume	:	102
Number	:	1
Pages	:	p.416 - 417
Publication Year/Month	:	2010/06
Meeting title	:	American Nuclear Society 2010 Annual Meeting
Held date	:	2010/06
Location (city)	:	San Diego
Location (country)	:	U.S.A.
Patent information	:
PDF	:
Paper URL	:
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	常陽(高速増殖炉実験炉)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : BB20100630
JAEA Abstracts No. : 39000063
Paper Submission No. : 8299

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.