A Rotatable photoelectron emission microscope combined with polarized synchrotron radiation

Sekiguchi, Tetsuhiro  ; Baba, Yuji  ; Shimoyama, Iwao   ; Hirao, Norie; Narita, Ayumi; Mannan, M. A.*; Koswattage, K.

Recently much higher-quality thin films are needed in the field of organic semiconductor development. We report on the project started recently: Method to map direction of chemical -bonds in nanometer scale. We are striving to develop a unique instrument to measure polarization-angle dependence of Near-edge X-ray absorption fine structure (NEXAFS) spectra at nano-meter level using photoelectron emission microscopy (PEEM), in order to understand creation and growth mechanisms of oriented domains. It is possible to measure XAFS spectra of microscopic regions magnified by the PEEM scope. The most unique point is the fact that the PEEM column can be rotated along the axis of synchrotron beam, so that one can measure polarization-angle dependences of such micro-XAFS spectra. Moreover, we demonstrate that other experimental and theoretical methods which provide complementary information for chemical and electronic states of organic films.