Positron annihilation study on vacancy-type defects in MBE-grown GaCrN films, 2

Yabuuchi, Atsushi; Maekawa, Masaki; Kawasuso, Atsuo; Hasegawa, Shigehiko*; Zhou, Y.*; Asahi, Hajime*

no abstracts in English

Language	:	Japanese
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Meeting title	:	2010年秋季第71回応用物理学会学術講演会
Held date	:	2010/09
Location (city)	:	長崎
Location (country)	:	日本
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Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
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Cooperating Institute	:	大阪大学

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Registration No. : BB20100884
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