Heavy ion Rutherford back scattering spectrometry at JAEA Tokai Tandem accelerator

Nakamura, Masahiko; Matsuda, Makoto  ; Asozu, Takuhiro  ; Sataka, Masao; Takahiro, Katsumi*; Matsunami, Noriaki*

We approached the HIRBS at JAEA Tokai Tandem accelerator facility. The sensitivity of the HIRBS depends on one's energy resolution, the optimization of kinematics geometry, the mass of an ion beam and a target, and so on. The beam species was Ne which expected to offer better mass resolution for target mass around 70 amu. In kinematics, higher energy ion beam provides higher energy resolution, but nuclear reactions will occur in too high energy region. Ne beam was accelerated by Tandem accelerator up to 1.25 MeV/u. Targets ware a thin Au foil (1 nm) and Cu foil (10 nm) deposited on crystal Si substrate, GaAs single crystal and Ge single crystal. Ion detector was a typical Silicon detector with a 3.2 mm aperture. The scattering angle was decided from typical RBS set-up as reference. We confirmed that the high energy HIRBS has enough mass resolution to analyze heavy elements in materials with a typical solid state detector, but not high resolution detection system.