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中性子反射率による表面・薄膜界面の研究

Surface and interface studies by neutron reflectivity

桜井 健次*; 日野 正裕*; 武田 全康

Sakurai, Kenji*; Hino, Masahiro*; Takeda, Masayasu

中性子反射率法は表面や界面の研究に有用な手法である。X線反射率と同様の情報が得られることに加えて、軽元素や磁性に対する感受性がX線に比べて高いという魅力的な特徴を持っている。本稿では、国内で現在使用可能な中性子反射率計の現状を紹介する。

Neutron reflectivity is a feasible probe for surfaces and interfaces. The technique has some common features to X-ray reflectivity, but at the same time it owns very unique and extremely attractive features, such as high-sensitivity to low Z elements and availability of magnetic structure analysis. The present article describes the recent activities of currently accessible neutron reflectometers in Japan.

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