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Impact of edge localized mode on photo-elastic-modulator based motional Stark effect polarimetry

Suzuki, Takahiro; Fujita, Takaaki

Intermittent increase in background light induced by edge localized mode (ELM) in high confinement mode (H-mode) plasma gives disturbances to polarization angle of incident light measured by motional Stark effect (MSE) polarimeter using photo-elastic modulator (PEM), even if the background light is not polarized. The error in the polarization angle determined by the light intensity at the frequency modulated by the PEM originates in a broadband frequency spectrum of the intermittent background light. When the ELM frequency $$tau$$$$_{rm ELM}$$ is sufficiently lower than a critical ELM frequency that is given by inverse of an apparent LPF time constant, the error has its peak, the height of which is independent of $$tau$$$$_{rm ELM}$$, soon after the ELM and vanishes between subsequent ELMs. However, when $$f$$$$_{rm ELM}$$ is higher than the critical ELM frequency, errors induced by subsequent ELMs pile up and the error increases with $$f$$$$_{rm ELM}$$. Other dependences on background light height, LPF time constant, polarization angle of incident light are analyzed.

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Category:Nuclear Science & Technology

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