Study on surface oxidation reactions of TiAl by synchrotron radiation X-ray photoemission spectroscopy

Hashinokuchi, Michihiro*; Sumimoto, Yuichi*; Tode, Mayumi; Okada, Michio*; Harries, J.; Teraoka, Yuden; Kasai, Toshio*

The oxidation processes on a TiAl surface induced by a hyperthermal O molecular beam (HOMB) with a translational energy of 2.2 eV was studied by X-ray photoemission spectroscopy in conjunction with synchrotron radiation. At a surface temperature of 300 K, the simultaneous growth of Al and Ti oxides accompanied with the segregation of AlO near the surface was observed. The efficiency of oxidation for the HOMB incidence was smaller than that for O backfilling (25 meV). Furthermore, the chemical compositions of oxide species (AlO, TiO, TiO) on the TiAl surface were independent on the translational energy of incident O molecules. The present results suggest that the oxidation on a TiAl surface proceed via molecular adsorption as a precursor state.