Difference of soft error rates in Bulk/SOI SRAM using high energy nuclear probes

Abo, Satoshi*; Masuda, Naoyuki*; Wakaya, Fujio*; Onoda, Shinobu; Makino, Takahiro; Hirao, Toshio; Iwamatsu, Toshiaki*; Oda, Hidekazu*; Takai, Mikio*

no abstracts in English

Language	:	Japanese
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Meeting title	:	2010年秋季第71回応用物理学会学術講演会
Held date	:	2010/09
Location (city)	:	長崎
Location (country)	:	日本
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DOI for research data	:
Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
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Article of JAEA R&D Review	:
Cooperating Institute	:	大阪大学

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Registration No. : BB20101781
JAEA Abstracts No. :
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