Observation of the SEU in the SOI devices induced by microbeam irradiation

Hirao, Toshio; Abo, Satoshi*; Onoda, Shinobu; Masuda, Naoyuki*; Makino, Takahiro; Oshima, Takeshi; Takai, Mikio*

no abstracts in English

Language	:	Japanese
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Meeting title	:	第23回タンデム加速器及びその周辺技術の研究会
Held date	:	2010/07
Location (city)	:	東京
Location (country)	:	日本
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Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
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Cooperating Institute	:	大阪大学極限量子科学研究センター

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Registration No. : BB20102065
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