Correlation between STM images and rest atom observed with XPS during Si(111)-77 oxidation at 300 K induced by O $_{2}$ molecular beam

no abstracts in English

Language	:	Japanese
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Meeting title	:	2010年秋季第71回応用物理学会学術講演会
Held date	:	2010/09
Location (city)	:	長崎
Location (country)	:	日本
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Keywords	:	no keyword
Research Facility	:	SPring-8(大型放射光施設)
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Registration No. : BB20101715
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Correlation between STM images and rest atom observed with XPS during Si(111)-77 oxidation at 300 K induced by O molecular beam

Correlation between STM images and rest atom observed with XPS during Si(111)-77 oxidation at 300 K induced by O $_{2}$ molecular beam