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X-ray study of radiation damage in UO$$_{2}$$ irradiated with high-energy heavy ions

Ishikawa, Norito  ; Sonoda, Takeshi*; Okamoto, Yoshihiro ; Sawabe, Takashi*; Takegahara, Keisuke; Kosugi, Shinya*; Iwase, Akihiro*

In order to characterize the radiation damage due to ion-track formation in UO$$_{2}$$, polycrystalline samples have been irradiated with 210-MeV Xe ions, and measured with XRD (X-ray diffraction) technique using Cu X-ray. We have also tried EXAFS (extended X-ray absorption fine structure) measurement using X-ray near U L$$_{3}$$-edge. The results show that XRD technique detects damage at relatively low fluence of 10$$^{16}$$ ions/m$$^{2}$$ and higher, while the irradiation-induced change of EXAFS spectra is not observed even at highest fluence of 10$$^{19}$$ ions/m$$^{2}$$. The damage detection may be critically influenced by the depth profile of X-ray penetration.



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Category:Materials Science, Multidisciplinary



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