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Temperature dependence of soft X-ray photoemission spectra for YbCu$$_2$$Si$$_2$$

Yasui, Akira; Fujimori, Shinichi   ; Kawasaki, Ikuto  ; Okane, Tetsuo  ; Takeda, Yukiharu   ; Saito, Yuji  ; Yamagami, Hiroshi; Sekiyama, Akira*; Settai, Rikio*; Matsuda, Tatsuma; Haga, Yoshinori   ; Onuki, Yoshichika*

YbCu$$_2$$Si$$_2$$ is one of valence fluctuating compounds. Though there are a few temperature ($$T$$)-dependent photoemission spectroscopy (PES) measurements for YbCu$$_2$$Si$$_2$$, there are different interpretations of the obtained spectra with each other. The previous studies were performed by using the vacuum ultraviolet (VUV) radiation. The VUV-PES spectra have considerably large contribution of the surface state. In order to examine the bulk electronic state in detail, it is needed to suppress the surface contribution. The soft X-ray PES (SX-PES) is a powerful tool to investigate the bulk electronic state. The SX-PES measurements were performed at BL23SU in SPring-8. In our SX-PES spectra, the surface Yb$$^{2+}$$ 4$$f$$ contribution is very small. With increasing $$T$$, the bulk Yb$$^{2+}$$ 4$$f$$ peaks shift toward the higher energy side, while the Yb$$^{3+}$$ multiplets do not move. Since the energy shift cannot be explained in the single impurity Anderson model, the experimental results indicate the Kondo lattice effects play important roles for YbCu$$_2$$Si$$_2$$.

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