Refine your search�ソスF     
Report No.

Polarization-analyzed resonant inelastic X-ray scattering of the orbital excitations in KCuF$$_3$$

Ishii, Kenji; Ishihara, Sumio*; Murakami, Yoichi*; Ikeuchi, Kazuhiko*; Kuzushita, Kaori*; Inami, Toshiya; Owada, Kenji; Yoshida, Masahiro; Jarrige, I.; Tatami, Naka*; Niioka, Shinya*; Bizen, Daisuke*; Ando, Yuya*; Mizuki, Junichiro; Maekawa, Sadamichi; Endo, Yasuo*

We report a Cu $$K$$-edge resonant inelastic X-ray scattering (RIXS) study of orbital excitations in KCuF$$_3$$. By performing the polarization analysis of the scattered photons, we disclose that the excitation between the $$e_g$$ orbitals and the excitations from $$t_{2g}$$ to $$e_g$$ exhibit distinct polarization dependence. The polarization dependence of the respective excitations is interpreted based on a phenomenological consideration of the symmetry of the RIXS process that yields a necessary condition for observing the excitations. In addition, we show that the orbital excitations are dispersionless within our experimental resolution.



- Accesses




Category:Materials Science, Multidisciplinary



[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.