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Change in hole concentration in Al-doped 6H-SiC by electron irradiation and thermal annealing

Matsuura, Hideharu*; Yanagisawa, Hideki*; Nishino, Kozo*; Myojin, Yoshiko*; Nojiri, Takunori*; Matsuyama, Yukei*; Onoda, Shinobu; Oshima, Takeshi

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