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Molecular effect of muon capture phenomena on nitrogen oxide molecules

Ninomiya, Kazuhiko; Ito, Takashi; Higemoto, Wataru; Strasser, P.*; Kawamura, Naritoshi*; Shimomura, Koichiro*; Miyake, Yasuhiro*; Miura, Taichi*; Kita, Makoto*; Shinohara, Atsushi*; Nagatomo, Takashi*; Kubo, Kenya*

A muonic atom is an atomic system that has one negatively charged muon instead of an electron. In this study, we examine the formation processes of muonic atoms for nitrogen oxide samples (NO, N$$_{2}$$O and NO$$_{2}$$) by measuring muon characteristic X-rays emitted after formation of muonic atoms, and the muon capture probabilities for these samples were determined. In the previous muon capture model, muon capture probability for each atom in molecule muonic atom is strongly influenced by the number of localized electrons in the atom. However, in our work, the experimental results were not reproduced by the previous model. In this paper, we discuss what influences on the muon capture probability.



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