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An ${it in-situ}$ relative calibration method for Thomson scattering diagnostics using a double-pass scattering system

Tojo, Hiroshi; Hatae, Takaki; Itami, Kiyoshi

A new method of in-situ relative calibration for Thomson scattering diagnostics using a double-pass scattering system is proposed. Ratio of scattered light signals between the first and second pass depend on electron temperature ($$T_{rm e}$$): thereby making evaluation of $$T_{rm e}$$ without considering relative transmissivities possible. Determination of relative transmissivities of each spectral channel can be assigned at the same time. Feasibility of the method based on parameters in a JT-60SA Thomson scattering diagnostic is also examined.

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