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Contribution of intermediate submicrometer structures to physical properties near $$T$$$$_{rm c}$$ in Pb(Zn$$_{1/3}$$Nb$$_{2/3}$$)O$$_{3}$$-9%PbTiO$$_{3}$$PbTiO$$_{3}$$

Owada, Kenji; Mizuki, Junichiro; Namikawa, Kazumichi*; Matsushita, Mitsuyoshi*; Shimomura, Susumu*; Nakao, Hironori*; Hirota, Kazuma*

Complementary use of coherent X-ray diffraction (CXD), X-ray diffuse scattering, conventional X-ray diffraction techniques and dielectric measurements has enabled us to investigate Pb(Zn$$_{1/3}$$Nb$$_{2/3}$$)O$$_{3}$$-9%PbTiO$$_{3}$$ with a multiple-length-scale approach from the macroscale (lattice constants, bulk averaged) and microscale to the nanoscale (polar nanoregions (PNRs)) and discuss the contribution of each scale to the dielectric permittivity.

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Category:Materials Science, Multidisciplinary

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