Measurement of apparent effective attenuation lengths in SiO $_{2}$ by SR-XPS and its debatable point

Jinno, Muneaki*; Inoue, Keisuke*; Teraoka, Yuden

no abstracts in English

Language	:	Japanese
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Meeting title	:	第37回表面分析研究会
Held date	:	2011/06
Location (city)	:	大阪
Location (country)	:	日本
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DOI for research data	:
Keywords	:	no keyword
Research Facility	:	SPring-8(大型放射光施設)
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Registration No. : BB20110548
JAEA Abstracts No. :
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Measurement of apparent effective attenuation lengths in SiO by SR-XPS and its debatable point

Measurement of apparent effective attenuation lengths in SiO $_{2}$ by SR-XPS and its debatable point