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Ion-beam-induced luminescence analysis as diagnostic tool for microstructure patterning on diamond by proton beam writing

Kada, Wataru; Yokoyama, Akihito; Koka, Masashi; Takano, Katsuyoshi*; Sato, Takahiro; Kamiya, Tomihiro

An Ion micro-Beam-Induced Luminescence (micro-IBIL) system was newly developed for the evaluation of the accuracy of proton beam writing on solid diamond surface. Fabrication of buried microstructures in bulk diamond (3.0 mm $$times$$ 3.0 mm $$times$$ 0.5 mm IIa single-crystal diamond) with a scanning microbeam was performed with using scanning focused 3 MeV proton microbeam. Photon counts of IBIL from the diamond were continuously observed and the changes were obtained during the process of PBW. An micro-IBIL image at a-band line of diamond crystal was successfully visualized as the PBW pattern on it through the monochromatic photon counting system of IBIL.

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Category:Physics, Applied

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