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Synchrotron radiation-based X-ray imaging study of ruthenium in simulated high-level waste glass

Okamoto, Yoshihiro ; Nakada, Masami ; Akabori, Mitsuo; Shiwaku, Hideaki  ; Komamine, Satoshi*; Fukui, Toshiki*; Ochi, Eiji*; Nitani, Hiroaki*; Nomura, Masaharu*

Distribution and the chemical state of Ru element in the simulated high-level waste glass were examined by using the synchrotron radiation based X-ray imaging technique. In this technique, a direct X-ray CCD camera is used in place of an ion chamber. Position sensitive X-ray absorption spectra were obtained by analyzing gray scale in images of the X-ray CCD camera. At first, we measured a test sample containing RuO$$_2$$ and Ru metal powder. We successfully obtained information on the Ru distribution in the sample. In addition, the chemical state (oxide or metal ?) of each small Ru-rich spot was evaluated by the corresponding position sensitive XAFS spectrum. The imaging XAFS technique was applied to some simulated high-level waste glass samples. The Ru distribution of the glass sample and their chemical state were confirmed by image analyses. It can be seen that Ru element scattered in the glass sample exists as oxide RuO$$_2$$.

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