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Electronic structure of heavy fermion uranium compounds; Soft X-ray photoelectron spectroscopy study

Fujimori, Shinichi   ; Okochi, Takuo*; Kawasaki, Ikuto  ; Yasui, Akira; Takeda, Yukiharu   ; Okane, Tetsuo  ; Saito, Yuji  ; Yamagami, Hiroshi; Haga, Yoshinori   ; Yamamoto, Etsuji  ; Onuki, Yoshichika

Angle resolved photoemission (ARPES) is a powerful experimental technique to study the electronic structure of materials. In particular, recent remarkable progress in ARPES experiments with high energy soft X-ray synchrotron radiation (SX-ARPES) made it possible to directly observe the bulk electronic structure of strongly correlated materials. In the present study, the results on the SX-ARPES on some strongly correlated uranium compounds will be presented.

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