Secondary ion emission from PTFE upon C $_{60}$ ion impacts

Hirata, Koichi*; Saito, Yuichi; Chiba, Atsuya; Yamada, Keisuke; Takahashi, Yasuyuki*; Narumi, Kazumasa; Kamiya, Tomihiro

Secondary ion (SI) yields from a Poly(tetrafluoroethylene) (PTFE) target for C $_{60}$ ion impacts were measured with an energy range from 30 keV to 270 keV by time-of-flight (TOF) SI mass analysis combined with SI electric current measurements. As a result, the use of impacts of C $_{60}$ ion with the increased incident energies (60 keV C $_{60}$ , 120 keV C $_{60}$ and 270 keV C $_{60}$ $^{2+}$ ) provided higher yields of the characteristic positive SIs for PTFE than those of lower energy C $_{60}$ ions (30-keV C $_{60}$ ) and advantageous for highly sensitive chemical analysis of PTFE.

Language	:	English
Journal	:	JAEA-Review 2011-043, JAEA Takasaki Annual Report 2010
Volume	:
Number	:
Pages	:	P. 156
Publication Year/Month	:	2012/01
Meeting title	:
Held date	:
Location (city)	:
Location (country)	:
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.11484/jaea-review-2011-043
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	産業技術総合研究所

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : AA20110677
JAEA Abstracts No. :
Paper Submission No. : 17452

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.

Secondary ion emission from PTFE upon C ion impacts

Secondary ion emission from PTFE upon C $_{60}$ ion impacts