The Near field and far field in situ characterization of soft X-ray laser beam by submicron-resolution LiF crystal X-ray detector

LiF結晶X線検出器による軟X線レーザーの近視野と遠視野像のその場観察

Faenov, A.*; Pikuz, T.; 福田 祐仁; 田中 桃子; 岸本 牧; 石野 雅彦; 錦野 将元; 神門 正城; 河内 哲哉; 永園 充*; 大橋 治彦*; 矢橋 牧名*; 登野 健介*; 仙波 泰徳*; 富樫 格*; 石川 哲也*; Mitorfanov, A.*; Vinogradov, A.*; 加藤 義章* 

Faenov, A.*; Pikuz, T.; Fukuda, Yuji; Tanaka, Momoko; Kishimoto, Maki; Ishino, Masahiko; Nishikino, Masaharu; Kando, Masaki; Kawachi, Tetsuya; Nagasono, Mitsuru*; Ohashi, Haruhiko*; Yabashi, Makina*; Tono, Kensuke*; Semba, Yasunori*; Togashi, Tadashi*; Ishikawa, Tetsuya*; Mitorfanov, A.*; Vinogradov, A.*; Kato, Yoshiaki*

It was demonstrate high quality, single - shot in situ imaging of the near field and the far field intensity distribution of laser-driven transient-collision plasma and free electron soft X-ray lasers (SXRL) beams with 700 nm spatial resolution by color center formation in LiF crystals. The method based on diffraction of SXRL beams on the periodical structures and registration of diffracted patterns by LiF X-ray detector is proposed. It is demonstrated experimentally and by modeling that such approach allows measuring the intensity, coherence and spectral distribution of SXRL beam across the beam with high accuracy.