Characterizing the luminescence properties of LiF crystal imaging detectors using femtosecond soft X-ray monochromatic free electron laser radiation

Pikuz, T. A.; Faenov, A.*; Fukuda, Yuji; Kando, Masaki; Bolton, P.; Mitorfanov, A.*; Vinogradov, A.*; Nagasono, Mitsuru*; Ohashi, Haruhiko*; Yabashi, Makina*; Tono, Kensuke*; Semba, Yasunori*; Togashi, Tadashi*; Ishikawa, Tetsuya*

The first measurements of optical features of photoluminescence from point defects in LiF crystals that were irradiated by soft X-ray femtosecond pulses of the Free Electron Laser at the SPring-8 compact SASE source were presented. Obtained results suggest that as the single pulse duration for the irradiation is reduced from nanoseconds down to picoseconds and below, the photoluminescence peak intensity is redistributed from the red to the green part of the spectrum. Dependence of peak intensity of photoluminescence spectra on soft X-ray irradiation fluence was also measured and an absence of quenching phenomena, even at relatively high fluencies was found.