Measurements and simulations of response of silicon semiconductor detector produced by incident neutron

Morishita, Yuki ; Sagawa, Naoki; Tsubaki, Hirohiko; Izaki, Kenji ; Mizuniwa, Harumi

no abstracts in English

Language	:	Japanese
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Meeting title	:	日本保健物理学会第45回研究発表会
Held date	:	2012/06
Location (city)	:	名古屋
Location (country)	:	日本
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Keywords	:	no keyword
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Registration No. : BB20120063
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