Transient ion-beam-induced current analysis of thin film CVD diamond detector

Kada, Wataru; Sato, Takahiro; Iwamoto, Naoya; Onoda, Shinobu; Makino, Takahiro; Koka, Masashi; Oshima, Takeshi; Kamiya, Tomihiro

Thin film Transmission diamond detector is now under development for the detection of single-ion-hit of MeV energy range ions. The radiation hardness of the detector needs to be investigated. The effect of the damage produced on the impact of high-energy heavy ions was evaluated by using Transient Ion Beam Induced Current (TIBIC) analysis system. The differences in the signals were obtained before and after the intense microbeam irradiation on the area of 5050 m through the comparison of the peak current and integral total charges of each single pulses induced by the single ion hit of 15 MeV O $^{4+}$ .

Language	:	English
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Meeting title	:	2nd RBI Detector Workshop on Diamond Detectors; Development and Applications
Held date	:	2012/05
Location (city)	:	Plitvice Lakes
Location (country)	:	Croatia
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Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
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Registration No. : BB20120161
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