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Quantitative measurement of hard X-ray spectra for high intensity laser produced plasma

Zhang, Z.*; Nishimura, Hiroaki*; Namimoto, Takura*; Fujioka, Shinsuke*; Arikawa, Yasunobu*; Nishikino, Masaharu; Kawachi, Tetsuya; Sagisaka, Akito; Hosoda, Hirokazu*; Orimo, Satoshi; Ogura, Koichi; Pirozhkov, A. S.; Yogo, Akifumi; Okano, Yasuaki*; Kiriyama, Hiromitsu; Kondo, Kiminori; Oshima, Shinsuke*; Azechi, Hiroshi*

X-ray line spectra ranging from 17 to 77 keV were quantitatively measured with a Laue spectrometer, composed of a cylindrically curved crystal and a detector. Either a visible CCD detector coupled with a CsI phosphor screen or an imaging plate can be chosen, depending on the signal intensities and exposure times. The absolute sensitivity of the spectrometer system was calibrated using pre-characterized laser-produced X-ray sources and radioisotopes. The integrated reflectivity for the crystal is in good agreement with predictions by an open code for X-ray diffraction. The energy transfer efficiency from incident laser beams to hot electrons, as the energy transfer agency for specific X-ray line emissions, is derived as a consequence of this work.

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