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Short-time change of heavy-ion microbeams with different mass to charge ratios by scaling method for the JAEA AVF cyclotron

Kurashima, Satoshi; Okumura, Susumu; Miyawaki, Nobumasa; Kashiwagi, Hirotsugu; Sato, Takahiro; Kamiya, Tomihiro; Fukuda, Mitsuhiro*; Yokota, Wataru

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Category:Instruments & Instrumentation



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