Microstructure observation of oriented samples from fault zone using scanning electron microscope

Nakayama, Kazuhiko ; Shimada, Koji ; Seshimo, Kazuyoshi ; Tanaka, Yoshihiro; Kametaka, Masao*; Okazaki, Kazuhiko*; Shimogama, Kota*; Hayashi, Toshio*

no abstracts in English

Language	:	Japanese
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Meeting title	:	日本地質学会第119年学術大会(大阪大会)
Held date	:	2012/09
Location (city)	:	堺
Location (country)	:	日本
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Keywords	:	no keyword
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Registration No. : BB20120753
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