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Report No.

Microstructure observation of oriented samples from fault zone using scanning electron microscope

Nakayama, Kazuhiko ; Shimada, Koji  ; Seshimo, Kazuyoshi ; Tanaka, Yoshihiro; Kametaka, Masao*; Okazaki, Kazuhiko*; Shimogama, Kota*; Hayashi, Toshio*

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